Eindhoven, Netherlands

Lukasz Redlarski

This inventor holds 4 USPTO granted patents and 1 published patent application and 1 EPO patent. Top assignee: Mitutoyo Corporation. Active years: 2017-2023.

USPTO Granted Patents = 4 

% Patents Active = 100.0

 

Average Co-Inventor Count = 2.5

ph-index = 1

Forward Citations = 5(Granted Patents)


Location History:

  • Eindhoven, NL (2017 - 2022)
  • Eindhoven, NE (2023)

Company Filing History:


Years Active: 2017-2023

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4 patents (USPTO):Explore Patents

Title: The Innovative Contributions of Lukasz Redlarski

Introduction

Lukasz Redlarski is a notable inventor based in Eindhoven, Netherlands. He has made significant contributions to the field of metrology, holding a total of 4 patents. His work focuses on advanced measurement systems that enhance precision and efficiency in various applications.

Latest Patents

One of Lukasz Redlarski's latest patents is a metrology system with a projected pattern for points-from-focus type processes. This innovative system includes an objective lens portion, a light source, a pattern projection portion, and a camera. The design allows for the use of different lenses with varying magnifications and cutoff frequencies. The projected pattern is designed to produce contrast on a workpiece surface, enabling the acquisition of an image stack from which focus curve data can be determined, indicating the three-dimensional positions of workpiece surface points.

Another significant patent is a shape measuring method that applies a periodic pattern to a light beam. This method involves displacing a focal point of an objective lens to calculate face shape data on the object being measured. The process includes acquiring face shape data on both the top and bottom surfaces of the object, ensuring comprehensive measurement accuracy.

Career Highlights

Lukasz Redlarski is currently employed at Mitutoyo Corporation, a leading company in precision measurement technology. His role involves developing innovative solutions that push the boundaries of metrology. His expertise and contributions have positioned him as a key figure in the field.

Collaborations

Lukasz has collaborated with notable colleagues such as Han Haitjema and Frans De Nooij. These partnerships have fostered a collaborative environment that enhances the development of cutting-edge measurement technologies.

Conclusion

Lukasz Redlarski's work exemplifies the spirit of innovation in metrology. His patents and contributions significantly advance the field, showcasing his dedication to precision measurement. His ongoing efforts continue to inspire advancements in technology and measurement systems.

Profile summary based on public USPTO records.
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