This inventor holds 1 USPTO granted patent. Top assignee: Infineon Technologies Richmond, LP. Active years: 2004.
Company Filing History:
Years Active: 2004
Title: The Innovative Contributions of Luis G Andrade
Introduction
Luis G Andrade is a notable inventor based in Glen Allen, VA (US). He has made significant contributions to the field of semiconductor technology. His work focuses on improving the efficiency and accuracy of yield loss calculations in semiconductor manufacturing.
Latest Patents
Luis G Andrade holds a patent for a "Method for semiconductor yield loss calculation." This innovative method calculates the yield loss of semiconductor wafers tested with a specific sequence. The process derives a total fail region count for each wafer, which contains multiple chips. The method involves calculating a fail region count for each test in the sequence, determining the test sequence limited yield loss for each wafer, and apportioning this loss based on the number of fails identified. Additionally, core parametric test data is correlated with the yield loss to analyze reparability.
Career Highlights
Luis G Andrade is currently employed at Infineon Technologies Richmond, LP. His role involves applying his expertise in semiconductor technology to enhance manufacturing processes. With a focus on yield loss calculations, he contributes to the development of more efficient semiconductor products.
Collaborations
Luis has collaborated with several professionals in his field, including Dieter Rathei and Joerg W Wohlfahrt. These collaborations have allowed for the exchange of ideas and advancements in semiconductor technology.
Conclusion
Luis G Andrade's innovative work in semiconductor yield loss calculation exemplifies the importance of precision in manufacturing processes. His contributions continue to impact the semiconductor industry positively.