St. Louis, MO, United States of America

Luciano Mule′Stagno


Average Co-Inventor Count = 2.9

ph-index = 2

Forward Citations = 12(Granted Patents)


Company Filing History:


Years Active: 2002-2003

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2 patents (USPTO):Explore Patents

Title: Luciano Mule’Stagno: Innovator in Silicon Technology

Introduction

Luciano Mule’Stagno is a prominent inventor based in St. Louis, MO (US). He has made significant contributions to the field of silicon technology, holding 2 patents that focus on improving the quality and detection of defects in silicon wafers. His work is essential for advancements in semiconductor manufacturing.

Latest Patents

Mule’Stagno's latest patents include "Epitaxial wafer substantially free of grown-in defects" and "Process for detecting agglomerated intrinsic point defects by metal decoration." The first patent addresses the creation of an epitaxial wafer that minimizes defects, enhancing the performance of silicon substrates. The second patent outlines a method for revealing intrinsic point defects in silicon samples, which is crucial for ensuring the integrity of semiconductor materials.

Career Highlights

Luciano Mule’Stagno is currently employed at Memc Electronic Materials, Inc., where he applies his expertise in silicon technology. His innovative approaches have contributed to the company's reputation as a leader in the semiconductor industry.

Collaborations

Mule’Stagno has collaborated with notable colleagues, including Robert J Falster and Lu Fei. These partnerships have fostered a collaborative environment that encourages innovation and the sharing of ideas.

Conclusion

Luciano Mule’Stagno's work in silicon technology exemplifies the impact of innovation in the semiconductor industry. His patents and collaborations continue to drive advancements in the field, ensuring the development of high-quality materials for future technologies.

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