This inventor holds 1 USPTO granted patent. Top assignee: Kla Tencor Corporation. Active years: 2012.
Company Filing History:
Years Active: 2012
Title: Luc Debarge - Innovator in Defect Classification Technology
Introduction
Luc Debarge is a notable inventor based in Dresden, Germany. He has made significant contributions to the field of defect classification technology. His innovative approach has led to the development of a patented method that enhances the analysis of defects on substrates.
Latest Patents
Luc Debarge holds a patent for a method titled "Multi-scale classification of defects." This computerized method categorizes defects on a substrate by analyzing input data that includes defect locations and associated micro-defect codes. The processor detects spatial clusters of defects and determines which clusters represent known and unknown macro-defects. The method involves changing micro-defect codes to macro-defect codes for known defects and analyzing unknown defects to identify predominantly occurring micro-defect codes. The final output is a changed list of defects on the substrate.
Career Highlights
Luc Debarge is currently employed at Kla Tencor Corporation, where he applies his expertise in defect classification. His work has been instrumental in advancing the technology used in substrate analysis. With a focus on innovation, he continues to contribute to the field through his research and development efforts.
Collaborations
Luc has collaborated with talented coworkers, including Saravanan Paramasivam and Patrick Huet. Their combined efforts have fostered a productive environment for innovation and technological advancement.
Conclusion
Luc Debarge is a pioneering inventor whose work in defect classification technology has made a significant impact in the industry. His patented method showcases his commitment to innovation and excellence in the field.