Durham, NH, United States of America

Lou Farkas

This inventor holds 1 USPTO granted patent. Top assignee: Carl Zeiss Microscopy Gmbh. Active years: 2015.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lou Farkas. Retrieved from https://idiyas.com/inventor/lou-farkas

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 4.0

ph-index = 1

Forward Citations = 2(Granted Patents)


Company Filing History:


Years Active: 2015

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1 patent (USPTO):Explore Patents

Title: Lou Farkas: Innovator in Gas Field Ionization Technology

Introduction

Lou Farkas is a notable inventor based in Durham, NH (US). She has made significant contributions to the field of ionization technology, particularly through her innovative patent. Her work has implications for various applications in microscopy and ion beam technology.

Latest Patents

Lou Farkas holds a patent for "Systems and methods for a gas field ionization source." This invention provides a gas field ion source assembly that includes an ion source connected to an optical column. The design allows an ion beam generated at the ion source to travel through the optical column. The ion source features an emitter with a tapered width that culminates in a tip comprising just a few atoms. Additionally, the methods outlined in the patent focus on manufacturing, maintaining, and enhancing the performance of the gas field ion source, including techniques for sharpening the tip of the ion source in situ.

Career Highlights

Lou Farkas is associated with Carl Zeiss Microscopy GmbH, a company renowned for its advancements in microscopy technology. Her role at the company has allowed her to contribute to cutting-edge research and development in the field.

Collaborations

Some of her notable coworkers include Billy W Ward and John A Notte, who have collaborated with her on various projects within the company.

Conclusion

Lou Farkas is a pioneering inventor whose work in gas field ionization technology has the potential to advance the field of microscopy. Her innovative patent reflects her commitment to enhancing scientific tools and methodologies.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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