Linda Gundal

Title: Linda Gundal - Innovator in Substrate Measurement Technology.

Introduction

Linda Gundal is a prominent inventor based in Braunfels, Germany. She has made significant contributions to the field of substrate measurement technology. Her innovative approach has led to the development of a unique method that enhances the accuracy of measurements in coordinate measuring machines.

Latest Patents

Linda holds a patent for a method titled "Method for determining correction values for the measured values of positions of structures on a substrate." This patent describes a technique for allocating correction values related to the bending of a substrate in relation to a coordinate system of a coordinate measuring machine. The method involves the automatic determination of the positions of reference marks on the substrate holder, ensuring precise measurements for each substrate placed in the machine.

Career Highlights

Linda Gundal is currently employed at Vistec Semiconductor Systems GmbH, where she continues to advance her research and development efforts. Her work focuses on improving measurement techniques that are crucial for the semiconductor industry.

Collaborations

Linda collaborates with her coworker, Wolfgang Fricke, to further enhance the capabilities of their projects. Together, they strive to push the boundaries of technology in their field.

Conclusion

Linda Gundal's innovative contributions to substrate measurement technology exemplify her dedication to advancing the industry. Her patent and ongoing work at Vistec Semiconductor Systems GmbH highlight her role as a key figure in this specialized area.