This inventor holds 1 USPTO granted patent. Top assignee: Chipmos Technologies Inc.. Active years: 2004.
Company Filing History:
Years Active: 2004
Title: Linck Cheng: Innovator in Memory Repair Analysis
Introduction
Linck Cheng is a prominent inventor based in Taichung, Taiwan. He has made significant contributions to the field of semiconductor testing, particularly in memory repair analysis. His innovative approach has led to advancements that enhance testing efficiency and reduce time.
Latest Patents
Linck Cheng holds a patent for a "Method and system for performing memory repair analysis." This invention provides a method and system that connects a merge circuit between the test storage device of semiconductor testing equipment and the pre-analysis storage device of the repair analysis apparatus. The process involves merging data from multiple functional tests into a functional test data set, which includes addresses of fail bits. This data is then stored in the pre-analysis storage device for further analysis. As a result, the test time is significantly reduced, and overall test efficiency is improved.
Career Highlights
Linck Cheng is associated with Chipmos Technologies Inc., a company known for its expertise in semiconductor testing and packaging. His work at Chipmos has allowed him to focus on innovative solutions that address challenges in the semiconductor industry. His contributions have been instrumental in enhancing the capabilities of memory repair analysis.
Collaborations
Linck Cheng has collaborated with notable colleagues, including An-Hong Liu and Vincent Wang. Their teamwork has fostered an environment of innovation and has led to the development of effective solutions in their field.
Conclusion
Linck Cheng's work in memory repair analysis exemplifies the impact of innovation in the semiconductor industry. His patent and contributions to Chipmos Technologies Inc. highlight his role as a key inventor in advancing technology.