The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 15, 2004
Filed:
Nov. 20, 2001
Applicant:
Inventors:
Yuan-Ping Tseng, Hsinchu, TW;
Vincent Wang, Jubei, TW;
Linck Cheng, Taichung, TW;
An-Hong Liu, Tainan, TW;
Assignee:
ChipMOS Technologies Inc., Hsinchu, TW;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G11C 2/900 ;
U.S. Cl.
CPC ...
G11C 2/900 ;
Abstract
A method and a system for performing memory repair analysis are provided. A merge circuit is connected between test storage device of semiconductor testing equipment and pre-analysis storage device of repair analysis apparatus. Prior to memory repair analysis process, data from a plurality of functional tests are merged as a functional test data with addresses of fail bits by the merge circuit, then stored in pre-analysis storage device for analyzing. Therefore, test time is reduced and test efficiency is improved.