Company Filing History:
1 out of 181 
1 out of 2 Years Active: 2016
Title: Lin-ai Tai: Innovator in Transmission Electron Microscopy
Introduction
Lin-ai Tai is a notable inventor based in Zhunan, Taiwan. He has made significant contributions to the field of microscopy, particularly in the preparation of specimens for transmission electron microscopy (TEM). His innovative approaches have enhanced the capabilities of nanoparticle characterization.
Latest Patents
Lin-ai Tai holds a patent for a TEM specimen kit designed for effective specimen preparation. The kit comprises a top substrate and a bottom substrate that are transparent and substantially parallel to each other. It includes a first spacer and a second spacer, which are positioned beneath the top substrate and rest on the bottom substrate. The second spacer is opposite to and spaced apart from the first spacer at a defined distance. A chamber is formed between the top and bottom substrates and between the first and second spacers, with two ends open to the atmosphere. This chamber is characterized by a height smaller than the diameter of a red blood cell. The patent also encompasses methods for preparing dry specimens for TEM nanoparticle characterization and analyzing TEM images of nanoparticles in liquid samples.
Career Highlights
Throughout his career, Lin-ai Tai has worked with esteemed organizations such as the National Health Research Institutes and Materials Analysis Technology Corporation. His work has been pivotal in advancing the understanding and application of transmission electron microscopy.
Collaborations
Lin-ai Tai has collaborated with notable colleagues, including Yong-fen Hsieh and Chih-hsun Chu. These collaborations have contributed to the development of innovative techniques in microscopy.
Conclusion
Lin-ai Tai's contributions to the field of transmission electron microscopy through his patent and collaborative efforts highlight his role as an influential inventor. His work continues to impact the scientific community and enhance the understanding of nanoparticle characterization.
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