The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 05, 2016
Filed:
Jul. 08, 2013
National Health Research Institutes, Zhunan Town, TW;
Materials Analysis Technology (Us) Corp, San Jose, CA (US);
Yong-fen Hsieh, Hsinchu, TW;
Chih-hsun Chu, Hsinchu, TW;
Pradeep Sharma, Hsinchu, TW;
Yu-feng Ko, Hsinchu, TW;
Chung-shi Yang, Zhunan, TW;
Lin-ai Tai, Zhunan, TW;
Yu-ching Chen, Zhunan, TW;
Hsiao-chun Ting, Zhunan, TW;
NATIONAL HEALTH RESEARCH INSTITUTES, Miaoli County, TW;
MATERIALS ANALYSIS TECHNOLOGY (US) CORP., San Jose, CA (US);
Abstract
A TEM specimen kit is disclosed, which comprises: (a) a top substrate and a bottom substrate, the top and the bottom substrates being transparent and substantially parallel to each other; (b) a first spacer and a second spacer, located beneath the top substrate and sitting on the bottom substrate, the second spacer being opposite to and spaced apart from the first spacer at a distance of d; and (c) a chamber formed between the top and bottom substrate and between the first and second spacer, the chamber having two ends open to the atmosphere and characterized by having a height defined by the thickness h of the spacer, wherein the height being smaller than the diameter of a red blood cell. Also enclosed are methods for preparing a dry specimen for TEM nanoparticle characterization, and methods for analyzing TEM images of nanoparticles in a liquid sample.