Yu-feng Ko

Title: Innovations of Yu-feng Ko in Transmission Electron Microscopy

Introduction

Yu-feng Ko is a notable inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of transmission electron microscopy (TEM) through his innovative patents. With a total of 2 patents, his work focuses on improving specimen preparation techniques for nanoparticle characterization.

Latest Patents

Yu-feng Ko's latest patents include a TEM specimen kit designed for efficient specimen preparation. This kit features a top and bottom substrate that are transparent and parallel, along with a first and second spacer that create a tiny chamber. The chamber's height is smaller than the diameter of a red blood cell, allowing for effective sorting of nanoparticles from blood cells. The methods outlined in his patents also provide techniques for preparing dry specimens and analyzing TEM images of nanoparticles in liquid samples. This innovation ensures that nanoparticles remain dispersed without aggregation during the drying process, making it suitable for accurate TEM observation.

Career Highlights

Throughout his career, Yu-feng Ko has worked with reputable organizations such as the National Health Research Institutes and Materials Analysis Technology Corporation. His experience in these institutions has contributed to his expertise in the field of materials analysis and microscopy.

Collaborations

Yu-feng Ko has collaborated with notable colleagues, including Yong-fen Hsieh and Chih-hsun Chu. These partnerships have further enhanced his research and development efforts in the field of transmission electron microscopy.

Conclusion

Yu-feng Ko's innovative contributions to transmission electron microscopy have paved the way for advancements in nanoparticle characterization. His patents reflect a deep understanding of the challenges in specimen preparation and offer practical solutions for researchers in the field.