Chung-shi Yang

Title: Innovations of Chung-shi Yang in Transmission Electron Microscopy

Introduction

Chung-shi Yang is a notable inventor based in Zhunan, Taiwan. He has made significant contributions to the field of transmission electron microscopy (TEM) through his innovative patent. His work focuses on enhancing the preparation and analysis of specimens for TEM, which is crucial for nanoparticle characterization.

Latest Patents

Chung-shi Yang holds a patent for a TEM specimen kit designed for effective specimen preparation. The kit comprises a top substrate and a bottom substrate that are transparent and parallel to each other. It includes a first and a second spacer, which are positioned beneath the top substrate and on the bottom substrate, maintaining a specific distance apart. A chamber is formed between these substrates and spacers, allowing for the analysis of specimens with a height smaller than the diameter of a red blood cell. This innovation also encompasses methods for preparing dry specimens for TEM nanoparticle characterization and analyzing TEM images of nanoparticles in liquid samples.

Career Highlights

Throughout his career, Chung-shi Yang has worked with esteemed organizations such as the National Health Research Institutes and Materials Analysis Technology Corporation. His experience in these institutions has contributed to his expertise in the field of microscopy and materials analysis.

Collaborations

Chung-shi Yang has collaborated with notable colleagues, including Yong-fen Hsieh and Chih-hsun Chu. These partnerships have furthered his research and development efforts in the field of transmission electron microscopy.

Conclusion

Chung-shi Yang's innovative contributions to transmission electron microscopy demonstrate his commitment to advancing scientific research. His patent and collaborative efforts highlight the importance of innovation in the field of microscopy.