Beijing, China

Limin Liu



 

Average Co-Inventor Count = 4.7

ph-index = 2

Forward Citations = 8(Granted Patents)


Company Filing History:


Years Active: 2015-2020

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5 patents (USPTO):Explore Patents

Title: Innovations and Contributions of Inventor Limin Liu

Introduction

Limin Liu is an accomplished inventor based in Beijing, China, recognized for his significant contributions to the field of image processing. With a portfolio of five patents, Liu’s work focuses on advancing methodologies for analyzing radiation images, showcasing his expertise and commitment to innovation.

Latest Patents

Limin Liu's latest patents illustrate his dedication to enhancing image analysis techniques. His patent titled "Method of assisting analysis of radiation image and system using the same" outlines a comprehensive approach to analyzing radiation images. This method includes acquiring radiation images, obtaining relevant customs declaration information, and utilizing a historical image library to assist inspectors in identifying violations or discrepancies.

Another notable patent is the "Radiation image inspection system and method based on B/S architecture." This system comprises a client terminal that initiates image operation requests to a web server. The architecture allows for efficient image processing and facilitates the generation of results that inspectors can display and analyze through their browsers. These innovations reflect a robust integration of technology and practical applications in image inspection.

Career Highlights

Throughout his career, Limin Liu has collaborated with renowned institutions that enhance his research and innovation efforts. He has worked for organizations like the Advanced Manufacture Technology Center and the China Academy of Machinery Science & Technology. His association with Tsinghua University, a leading research institution, has further boosted his profile as an inventor and innovator in the field.

Collaborations

In his journey, Limin Liu has partnered with notable colleagues such as Zhongde Shan and Feng Liu. These collaborations have enabled the development of advanced technologies and solutions in image processing, contributing to the broader field of radiation inspection systems.

Conclusion

Limin Liu stands as a prominent figure in the innovation landscape, particularly in image processing related to radiation analysis. His patents not only provide novel solutions for radiation image inspection but also reflect his broader contributions to the field. With a strong foundation in research and collaboration, Liu continues to inspire advancements that can significantly impact technology and safety regulations in various industries.

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