The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Nov. 10, 2020
Filed:
Nov. 06, 2017
Nuctech Company Limited, Beijing, CN;
Zhiqiang Chen, Beijing, CN;
Yuanjing Li, Beijing, CN;
Xianghao Wu, Beijing, CN;
Jundi Dai, Beijing, CN;
Yange Du, Beijing, CN;
Limin Liu, Beijing, CN;
NUCTECH COMPANY LIMITED, Beijing, CN;
Abstract
The present application relates to a method of assisting analysis of a radiation image and a system using the same, which belongs to the field of image processing. A method of assisting analysis of a radiation image includes: acquiring a radiation image to be analyzed; acquiring customs declaration information of the radiation image to be analyzed; acquiring a feature-matched historical image from a typical image library according to the radiation image to be analyzed; and/or acquiring a standard image and/or detailed customs declaration information of the standard image according to the customs declaration information of the radiation image to be analyzed. The method of assisting analysis of a radiation image and the system using the same may assist an image inspection person to judge whether or not the current radiation image carries violation items, whether or not a concealing or missing report occurs and so on.