Lihua Lei

Title: Lihua Lei: Innovator in Electron Probe Microanalysis Calibration

Introduction

Lihua Lei is a prominent inventor based in Shanghai, China. She has made significant contributions to the field of electron probe microanalysis through her innovative methods and techniques. Her work focuses on improving the accuracy and efficiency of measurement instruments.

Latest Patents

Lihua Lei holds a patent titled "Method for calibrating parameter error of electron probe microanalysis instrument." This patent discloses a method for calibrating parameter errors in electron probe microanalysis instruments. The process involves preparing a one-dimensional grating standard template using atom lithography technology. A theoretical grating period D is calculated, and the template is placed on the instrument's stage. The instrument scans the template, performs image acquisition, and measures the grid distance to obtain a measurement value L. A calibration factor K is then calculated based on D and L. This method effectively shortens the traceability chain for instrument calibration and reduces error accumulation in the measurement process.

Career Highlights

Lihua Lei has worked at notable institutions such as Tongji University and the Shanghai Institute of Measurement and Testing Technology. Her experience in these organizations has allowed her to develop her expertise in measurement technology and instrument calibration.

Collaborations

Lihua has collaborated with esteemed colleagues, including Yingfan Xiong and Chengming Cao. These collaborations have further enhanced her research and development efforts in the field of electron probe microanalysis.

Conclusion

Lihua Lei's innovative contributions to the calibration of electron probe microanalysis instruments demonstrate her commitment to advancing measurement technology. Her patent and career achievements reflect her significant impact on the field.