Plano, TX, United States of America

Lianrui Zhang

This inventor holds 3 USPTO granted patents. Top assignee: Texas Instruments Corporation. Active years: 2008-2010.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Lianrui Zhang. Retrieved from https://idiyas.com/inventor/lianrui-zhang

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 1.6

ph-index = 2

Forward Citations = 16(Granted Patents)


Company Filing History:


Years Active: 2008-2010

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3 patents (USPTO):Explore Patents

Title: Lianrui Zhang: Innovator in Device Testing Technologies

Introduction

Lianrui Zhang is a notable inventor based in Plano, TX (US). He has made significant contributions to the field of device testing, holding a total of 3 patents. His work focuses on improving the efficiency and accuracy of testing methods for various devices.

Latest Patents

One of Lianrui Zhang's latest patents is titled "Method and system for testing a settling time for a device-under-test." This patent describes a system and method for testing the settling time of a device-under-test (DUT). The method involves activating the DUT to generate an output signal and mixing this output signal with a reference signal to create a mixed signal. An amplitude threshold is set for the mixed signal, and the settling time of the DUT is determined based on the last time the amplitude of the mixed signal crosses this threshold relative to the DUT's activation.

Another significant patent is "Built in loop back self test in design or on test board for transceivers." This invention outlines a method and system for testing a transceiver communication device operating in a test mode. It involves adjusting a transmitter output signal and providing it as a loop back to a receiver. The adjustment includes shifting the frequency and attenuating the amplitude of the transmitter output signal to match predefined parameters of the receiver input signal. The device's pass or fail status is determined by comparing the transmitted and received data.

Career Highlights

Lianrui Zhang is currently employed at Texas Instruments Corporation, where he continues to innovate and develop new testing technologies. His work has had a significant impact on the efficiency of device testing processes.

Collaborations

He has collaborated with notable coworkers, including Dale A Heaton and Craig James Lambert, contributing to various projects and advancements in their field.

Conclusion

Lianrui Zhang's contributions to device testing technologies through his patents and work at Texas Instruments Corporation highlight his role as an influential inventor. His innovative methods are paving the way for more efficient testing processes in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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