The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Mar. 04, 2008

Filed:

Oct. 08, 2004
Applicants:

Dale A. Heaton, Lucas, TX (US);

Lianrui Zhang, Plano, TX (US);

Craig Lambert, Plano, TX (US);

Inventors:

Dale A. Heaton, Lucas, TX (US);

Lianrui Zhang, Plano, TX (US);

Craig Lambert, Plano, TX (US);

Assignee:
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
H04B 17/00 (2006.01);
U.S. Cl.
CPC ...
Abstract

According to one embodiment of the invention, a system for testing electronic devices includes a first RF source operable to output a first signal, a second RF source operable to output a second signal, a combiner coupled to the first and second RF sources and operable to combine the first and second signals to create a third signal, one or more down converters operable to receive respective output signals from respective electronic devices and create respective down converted signals, and a set of switches operable to switch the second RF source to a local oscillator function that couples to the one or more down converters for inputting respective reference signals into the one or more down converters.


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