The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jan. 12, 2010
Filed:
Feb. 22, 2006
Applicant:
Lianrui Zhang, Plano, TX (US);
Inventor:
Lianrui Zhang, Plano, TX (US);
Assignee:
Texas Instruments Incorporated, Dallas, TX (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R 27/28 (2006.01);
U.S. Cl.
CPC ...
Abstract
A system and method are disclosed for testing a settling time of a device-under-test (DUT). A method for determining a settling time of a device-under-test (DUT) includes activating a DUT to generate an output signal and mixing the output signal of the DUT and a reference signal to generate a mixed signal. An amplitude threshold is set for the mixed signal relative to an amplitude of the mixed signal and the settling time of the DUT is determined based on a last time that the amplitude of the mixed signal crosses the amplitude threshold relative to the activation of the DUT.