This inventor holds 1 USPTO granted patent. Top assignee: Kla-Tencor Technologies Corporation. Active years: 2010.
Company Filing History:
Years Active: 2010
Title: Lian Yao: Innovator in Defect Review Processes
Introduction
Lian Yao is a notable inventor based in Woodridge, IL (US). She has made significant contributions to the field of defect review processes, showcasing her expertise through her innovative patent.
Latest Patents
Lian Yao holds a patent titled "Methods, defect review tools, and systems for locating a defect in a defect review process." This patent outlines methods that include acquiring images and data from an inspection tool. The images illustrate areas on a specimen where defects are located, while the data indicates the position and features of these defects. The method also involves acquiring additional images of the specimen near the defect's position and identifying corresponding portions of these images. Ultimately, the method determines the defect's position within the additional images using the provided data. Lian Yao's patent represents a significant advancement in defect review technology.
Career Highlights
Lian Yao is currently employed at Kla-Tencor Technologies Corporation, where she continues to develop innovative solutions in her field. Her work has been instrumental in enhancing defect review processes, making her a valuable asset to her company.
Collaborations
Lian Yao collaborates with talented individuals such as Da Chen and Joe Wang. These partnerships contribute to her innovative projects and the advancement of technology in defect review processes.
Conclusion
Lian Yao's contributions to the field of defect review processes through her patent and work at Kla-Tencor Technologies Corporation highlight her role as an influential inventor. Her innovative methods and tools are paving the way for advancements in defect detection and review.