Hsinchu, Taiwan

Li-Chun Hung

USPTO Granted Patents = 2 

Average Co-Inventor Count = 7.0

ph-index = 1


Company Filing History:


Years Active: 2023-2025

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2 patents (USPTO):Explore Patents

Title: Li-Chun Hung: Innovator in Chip Structure Technology

Introduction

Li-Chun Hung is a prominent inventor based in Hsinchu, Taiwan. He has made significant contributions to the field of semiconductor technology, particularly in chip structure design. With a total of 2 patents to his name, his work continues to influence advancements in the industry.

Latest Patents

Li-Chun Hung's latest patents focus on innovative chip structures that enhance performance and reliability. One of his notable patents is a "Chip structure with conductive pillar and method for forming the same." This invention includes a substrate, a first conductive line, and an insulating layer, with a conductive pillar that passes through the insulating layer. The design ensures that the conductive pillar is in direct contact with the first conductive line, optimizing the chip's functionality. Another patent, titled "Chip structure and method for forming the same," also emphasizes the integration of a conductive pillar and solder bump, further showcasing his expertise in semiconductor design.

Career Highlights

Li-Chun Hung is currently employed at Taiwan Semiconductor Manufacturing Company Limited, a leading firm in the semiconductor industry. His role involves developing advanced chip structures that are crucial for modern electronic devices. His innovative approach has positioned him as a key player in the field.

Collaborations

Li-Chun has collaborated with talented coworkers, including Shan-Yu Huang and Ming-Da Cheng. These partnerships have fostered a creative environment that encourages the development of groundbreaking technologies.

Conclusion

Li-Chun Hung's contributions to chip structure technology exemplify his dedication to innovation in the semiconductor industry. His patents reflect a commitment to enhancing electronic performance and reliability.

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