Mierlo, Netherlands

Lex Alving


 

Average Co-Inventor Count = 4.3

ph-index = 2

Forward Citations = 20(Granted Patents)


Location History:

  • Eindhoven, NL (2009)
  • Mierlo, NL (2013 - 2015)

Company Filing History:


Years Active: 2009-2015

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4 patents (USPTO):Explore Patents

Title: Lex Alving: Innovator in X-ray Sensor Technology

Introduction

Lex Alving is a notable inventor based in Mierlo, Netherlands. He has made significant contributions to the field of X-ray sensor technology, holding a total of 4 patents. His work focuses on improving the performance and efficiency of X-ray detectors, which are crucial in various medical and industrial applications.

Latest Patents

One of Lex Alving's latest patents is a processing circuit for an X-ray sensor. This invention involves a processing circuit designed to collect pixel information from multiple pixels. The circuit includes an amplifier, a feedback loop, and a collecting device. It also compensates for non-linearity in the pixels by applying an inverse non-linearity in the periphery of the X-ray sensor. Another significant patent is for a high dynamic range X-ray detector that enhances the signal-to-noise ratio. This invention allows for automatic sensitivity selection in each pixel, ensuring that both low and high signals are captured effectively without losing information.

Career Highlights

Throughout his career, Lex Alving has worked with prominent companies such as Koninklijke Philips Corporation N.V. and Trixell. His experience in these organizations has contributed to his expertise in developing advanced X-ray technologies.

Collaborations

Lex has collaborated with notable professionals in his field, including Walter Ruetten and Tiemen Poorter. These collaborations have further enriched his work and innovations in X-ray sensor technology.

Conclusion

Lex Alving's contributions to X-ray sensor technology demonstrate his commitment to innovation and excellence. His patents reflect a deep understanding of the challenges in the field and offer solutions that enhance the performance of X-ray detectors.

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