Koninklijke Philips Corporation N.v.

Trixell

Philips Intellectual Property & Standards Gmbh

Lex Alving

Walter Ruetten

Tiemen Poorter

Michael Overdick

Dirk Willem Harberts

Martin John Powell

Augusto Nascetti

Anthony Roy Franklin

Roelf Van Der Wal

Hans Stouten

Thomas Frederik Buss

Stephanus Berardus Worm

Peter Bas Anton Wolfs

Peter B A Wolfs

Thomas F Buss

A processing circuit for an X-ray sensor for collecting at least a first pixel information of a first pixel and a second pixel information of a second pixel is provided. The processing circuit comprises an amplifier (), a feedback loop () and a first collecting device (). It is provided a compensation for a non-linearity in the pixels or in the pixel circuits () by applying an inverse non-linearity () in the periphery of the X-ray sensor. A processing circuit () may provide a copy of a pixel voltage and/or of a pixel charge. In the case of pixel charge a non-linear characteristic of a pixel capacitance may be compensated.

Processing circuit for an X-ray sensor

An x-ray detector and its pixel circuit are described, that allow to cover a large dynamic range with automatic selection of the sensitivity setting in each pixel, thus providing improved signal to noise ratio with all exposure levels. X-ray detectors are required to cover a large dynamic range. The largest exposure determines the required pixel capacitance. However, a large pixel capacitance gives a bad signal to noise ratio with small exposures e.g. in the dark parts of the image. This invention disclosure describes several approaches to provide automatic sensitivity selection in the pixels. This ensures that low signals are stored in a small capacitor or read out with a high sensitivity with corresponding good signal to noise ratio, while larger signals are stored in larger capacitors or are read out with lower sensitivity so that no information is lost.

High dynamic range X-ray detector with improved signal to noise ratio

An Y-ray detector apparatus comprises an array of detector pixels arranged into a plurality of sub-arrays. The pixels in each sub-array share a common dose sensing output provided to a dose sensing output conductor which extends to a periphery of the pixel array. The dose sensing output conductor for one sub-array of pixels passes through the area occupied by another sub-array of pixels, which can lead to unwanted cross talk. The invention provides a plurality of additional screening electrodes, with a screening electrode substantially adjacent the dose sensing output conductor for each sub-array of pixels. These screening electrodes reduce cross talk between the dose sensing output and other pixel electrodes. In another arrangement, each pixel further comprises a pixel electrode for each pixel formed at an upper region of the array, and the dose sensing output conductors are formed at a lower region of the array. An intermediate conductor layer is then provided which overlaps the dose sensing output conductors for other sub-arrays of pixels and which pass through the area occupied by the sub-array of pixels.

X-ray image detector

In a flat X-ray detector, Electromagnetic Interference (EMI) is reduced by either opening a pickup loop between the common lines () and the reference plane () of the PCB, or by reducing the size of a pickup loop by providing a permanent connection () between the common supply line and the reference plane () in respect of each row of photoconductors ().

Digital flat X-ray detector

Growing community of inventors

Mierlo, Netherlands

Lex Alving