The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 01, 2013

Filed:

Jun. 19, 2009
Applicants:

Walter Ruetten, Linnich, DE;

Lex Alving, Mierlo, NL;

Thomas Frederik Buss, Tilburg, NL;

Tiemen Poorter, Eindhoven, NL;

Peter Bas Anton Wolfs, Veldhoven, NL;

Inventors:

Walter Ruetten, Linnich, DE;

Lex Alving, Mierlo, NL;

Thomas Frederik Buss, Tilburg, NL;

Tiemen Poorter, Eindhoven, NL;

Peter Bas Anton Wolfs, Veldhoven, NL;

Assignee:

Trixell, Moirans, FR;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T 1/24 (2006.01);
U.S. Cl.
CPC ...
Abstract

An x-ray detector and its pixel circuit are described, that allow to cover a large dynamic range with automatic selection of the sensitivity setting in each pixel, thus providing improved signal to noise ratio with all exposure levels. X-ray detectors are required to cover a large dynamic range. The largest exposure determines the required pixel capacitance. However, a large pixel capacitance gives a bad signal to noise ratio with small exposures e.g. in the dark parts of the image. This invention disclosure describes several approaches to provide automatic sensitivity selection in the pixels. This ensures that low signals are stored in a small capacitor or read out with a high sensitivity with corresponding good signal to noise ratio, while larger signals are stored in larger capacitors or are read out with lower sensitivity so that no information is lost.


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