Gaithersburg, MD, United States of America

Leonard M Hanssen


Average Co-Inventor Count = 3.3

ph-index = 3

Forward Citations = 37(Granted Patents)


Company Filing History:


Years Active: 1996-1998

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3 patents (USPTO):Explore Patents

Title: The Innovations of Leonard M Hanssen

Introduction

Leonard M Hanssen is a notable inventor based in Gaithersburg, MD (US). He has made significant contributions to the field of optical measurement, holding a total of 3 patents. His work focuses on developing advanced technologies that enhance the accuracy and efficiency of reflectance and transmittance measurements.

Latest Patents

One of Hanssen's latest patents is a variable angle reflectometer employing an integrating sphere and a light. This reflectometer and method are designed for measuring the reflectance and transmittance of materials using an integrating sphere and a light concentrator. The measurements are performed as a function of the angle of incidence of a beam of light onto a sample and reference material. In a preferred embodiment, a CHC-lens concentrator with a high f/# and a low index of refraction is utilized. Another significant patent is for an infrared neutral-density filter having a copper alloy film. This optical filter features a dielectric substrate and a film composed primarily of copper and nickel. The film is preferably made of Constantan, which consists of 55% copper and 45% nickel. This filter achieves a high optical density with minimal spectral variation.

Career Highlights

Throughout his career, Leonard M Hanssen has worked with esteemed organizations, including the United States Navy and the U.S. Department of Commerce. His contributions to these institutions have been instrumental in advancing optical technologies.

Collaborations

Hanssen has collaborated with notable colleagues such as Keith A Snail and David B Chenault. Their combined expertise has furthered the development of innovative optical solutions.

Conclusion

Leonard M Hanssen's work exemplifies the spirit of innovation in optical measurement technologies. His patents reflect a commitment to enhancing measurement accuracy and efficiency in various applications.

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