USA As Represented by Secretary of the Navy

Government of the United States of America, As Represented by the Secretary of Commerce

Leonard M Hanssen

David B Chenault

Keith A Snail

Raju U Datla

Zhuomin M Zhang

Roy Schiff

A reflectometer and a method for measuring the reflectance and transmittance of material using an integrating sphere and a light concentrator. The reflectance and transmittance measurements are performed as a function of the angle of incidence of a beam of light onto a sample and reference material. In a preferred embodiment, a CHC-lens concentrator having a high f/# and a low index of refraction is used.

Variable angle reflectometer employing an integrating sphere and a light

A neutral-density optical filter has a dielectric substrate and a film costing essentially of copper and nickel. The film is preferably formed of Constantan, which is 55% copper and 45% nickel. The filter achieves a high optical density with a low spectral variation.

Infrared neutral-density filter having copper alloy film

A reflectometer wherein a light having a predetermined wavelength is projected into an integrating sphere containing a sample whose reflectance is to be measured. As the projected light strikes the sample, rays are reflected back the walls of the integrating sphere; some of which strike the area within the field-of-view of a concentrator. The rays striking within the field-of-view of the concentrator are focused upon a detector element which allows one to determine the reflectance of the sample. A control means is utilized to control the wavelength of the projected light through a spectrophotometer, and calculate the reflectance of the sample.

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Gaithersburg, MD, United States of America

Leonard M Hanssen