The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 1998
Filed:
Jul. 31, 1995
Applicant:
Inventors:
Keith A Snail, Silver Spring, MD (US);
Leonard Hanssen, Gaithersburg, MD (US);
David Chenault, Mary Esther, FL (US);
Assignee:
The United States of America as represented by the Secretary of the Navy, Washington, DC (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01J / ;
U.S. Cl.
CPC ...
356236 ;
Abstract
A reflectometer and a method for measuring the reflectance and transmittance of material using an integrating sphere and a light concentrator. The reflectance and transmittance measurements are performed as a function of the angle of incidence of a beam of light onto a sample and reference material. In a preferred embodiment, a CHC-lens concentrator having a high f/# and a low index of refraction is used.