Laurent Segarra

Title: Laurent Segarra: Innovator in Integrated Circuit Testing

Introduction

Laurent Segarra is a notable inventor based in Tournefeuille, France. He has made significant contributions to the field of integrated circuit testing, holding a total of 2 patents. His work focuses on developing methods and apparatuses that enhance the reliability and performance of electronic devices.

Latest Patents

One of Laurent's latest patents is a screening method and apparatus for detecting deep trench isolation and SOI defects. This invention provides a testing method for integrated circuit devices, utilizing a dedicated ground bias pad connected to a high voltage electrostatic discharge clamp circuit. By applying specific voltages to bias the wafer substrate and well region, the invention allows for the screening of defects in the buried insulator layer by measuring leakage current.

Another significant patent is related to a CAN module and method. This CAN module includes a bit duration compensation component that generates a compensated transmit command signal. This signal controls the driver component to drive a dominant state on the CAN bus, ensuring effective communication in digital systems.

Career Highlights

Throughout his career, Laurent has worked with prominent companies such as NXP USA, Inc. and NXP B.V. His experience in these organizations has contributed to his expertise in integrated circuit technology and innovation.

Collaborations

Laurent has collaborated with notable professionals in his field, including Maarten Jacobus Swanenberg and Pierre Turpin. These collaborations have further enriched his work and contributed to advancements in integrated circuit testing.

Conclusion

Laurent Segarra is a distinguished inventor whose work in integrated circuit testing has led to valuable innovations. His patents reflect his commitment to enhancing electronic device reliability and performance.