Larry John Dibattista

Title: Larry John Dibattista: Innovator in Semiconductor Technology

Introduction

Larry John Dibattista is a notable inventor based in Cupertino, CA (US). He has made significant contributions to the field of semiconductor technology, particularly in the area of testing semiconductor devices. His innovative work has led to the development of a patent that addresses critical aspects of semiconductor die testing.

Latest Patents

Larry John Dibattista holds a patent for "Methods, apparatus, and systems for contacting semiconductor dies that are electrically coupled to test access interface positioned in scribe lines of a wafer." This patent describes a semiconductor device that includes a first wafer with a plurality of semiconductor dies and scribe lines adjacent to these dies. The invention features a test access interface positioned in the scribe lines, which includes a first plurality of through-substrate conductors with a standardized physical layout. Additionally, it outlines electrical couplings between some of the through-substrate conductors and at least one of the semiconductor dies. The patent also discloses methods, apparatus, and systems for testing various types of semiconductor devices.

Career Highlights

Larry John Dibattista is currently associated with Advantest Corporation, where he continues to push the boundaries of semiconductor technology. His work has been instrumental in enhancing the efficiency and effectiveness of semiconductor testing processes.

Collaborations

Larry collaborates with Duncan Gurley, a fellow innovator in the field. Their combined expertise contributes to advancements in semiconductor technology and testing methodologies.

Conclusion

Larry John Dibattista's contributions to semiconductor technology through his innovative patent and collaboration with industry professionals highlight his role as a key inventor in this field. His work continues to influence the development of efficient testing methods for semiconductor devices.