Pleasanton, CA, United States of America

Larissa Juschkin

USPTO Granted Patents = 3 

Average Co-Inventor Count = 2.6

ph-index = 1


Company Filing History:


Years Active: 2022-2024

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3 patents (USPTO):

Title: The Innovative Contributions of Larissa Juschkin

Introduction

Larissa Juschkin is a prominent inventor based in Pleasanton, California. She has made significant contributions to the field of optical systems, holding three patents that showcase her expertise and innovative spirit. Her work focuses on advancing optical characterization methods, particularly in extreme ultraviolet metrology.

Latest Patents

One of her latest patents is titled "Optical etendue matching methods for extreme ultraviolet metrology." This patent describes an optical characterization system that includes a synchrotron source, an optical characterization sub-system, and a sensor designed to receive a projected image from a set of imaging optics. The system aims to match the etendue of a light beam output by the synchrotron source to the set of illumination optics. Another notable patent is "Determining one or more characteristics of light in an optical system." This patent outlines methods and systems for determining characteristics of light in an optical system, utilizing detectors configured to detect light at specific wavelengths and angles.

Career Highlights

Larissa Juschkin has established herself as a key figure in her field through her innovative patents and contributions to optical technology. Her work at Kla Corporation has allowed her to collaborate with other talented professionals and push the boundaries of optical research.

Collaborations

Some of her notable coworkers include Konstantin Tsigutkin and Zefram Marks. Their collaborative efforts have further enhanced the research and development of optical systems.

Conclusion

Larissa Juschkin's contributions to optical technology and her innovative patents reflect her dedication to advancing the field. Her work continues to inspire future developments in optical characterization methods.

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