The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Apr. 23, 2024

Filed:

Apr. 29, 2020
Applicant:

Kla Corporation, Milpitas, CA (US);

Inventors:

Zefram Marks, Gilroy, CA (US);

Larissa Juschkin, Pleasanton, CA (US);

Daniel C. Wack, Fredericksburg, VA (US);

Assignee:

KLA Corporation, Milpitas, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H05H 13/04 (2006.01); G01N 21/88 (2006.01); G02B 26/08 (2006.01); G02F 1/11 (2006.01); H05H 7/04 (2006.01); H05H 7/00 (2006.01);
U.S. Cl.
CPC ...
H05H 13/04 (2013.01); G01N 21/8806 (2013.01); G02B 26/085 (2013.01); G02F 1/11 (2013.01); H05H 7/04 (2013.01); G01N 2021/8887 (2013.01); H05H 2007/002 (2013.01); H05H 2007/005 (2013.01);
Abstract

An optical characterization system is disclosed. The optical characterization system may comprise a synchrotron source, an optical characterization sub-system, and a sensor configured to receive a projected image from a set of imaging optics. The optical characterization sub-system may include at least the set of illumination optics, a set of imaging optics, and a diffractive optical element, a temporal modulator or an optical waveguide configured to match an etendue of a light beam output by the synchrotron source to the set of illumination optics. A method of matching the etendue of a light beam is also disclosed.


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