The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Nov. 15, 2022

Filed:

May. 27, 2020
Applicant:

Kla Corporation, Milpitas, CA (US);

Inventors:

Larissa Juschkin, Pleasanton, CA (US);

Konstantin Tsigutkin, Pleasanton, CA (US);

Assignee:

KLA Corp., Milpitas, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N 21/95 (2006.01); G01N 21/33 (2006.01); G01N 23/20 (2018.01); G01J 1/04 (2006.01); G01J 1/42 (2006.01); G03F 1/84 (2012.01); G01N 21/956 (2006.01); G01J 1/44 (2006.01);
U.S. Cl.
CPC ...
G01N 21/9505 (2013.01); G01J 1/0411 (2013.01); G01J 1/0474 (2013.01); G01J 1/429 (2013.01); G01J 1/4228 (2013.01); G01J 1/4257 (2013.01); G01N 21/33 (2013.01); G01N 21/956 (2013.01); G01N 23/20 (2013.01); G03F 1/84 (2013.01); G01J 2001/444 (2013.01); G01N 2021/335 (2013.01); G01N 2021/95676 (2013.01); G01N 2201/0636 (2013.01); G01N 2223/052 (2013.01);
Abstract

Methods and systems for determining one or more characteristics of light in an optical system are provided. One system includes first detector(s) configured to detect light having one or more wavelengths shorter than 190 nm emitted from a light source at one or more first angles mutually exclusive of one or more second angles at which the light is collected from the light source by an optical system for illumination of a specimen and to generate first output responsive to the light detected by the first detector(s). In addition, the system includes a control subsystem configured for determining one or more characteristics of the light at one or more planes in the optical system based on the first output.


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