San Jose, CA, United States of America

KuoFeng Tseng

This inventor holds 1 USPTO granted patent. Top assignee: Hermes Microvision Inc.. Active years: 2017.

IDiyas Innovation Intelligence. (2026). Inventor Profile: KuoFeng Tseng. Retrieved from https://idiyas.com/inventor/kuofeng-tseng

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 3.0

ph-index = 1


Company Filing History:


Years Active: 2017

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1 patent (USPTO):Explore Patents

Title: KuoFeng Tseng: Innovator in Laser Technology

Introduction

KuoFeng Tseng is a notable inventor based in San Jose, CA. He has made significant contributions to the field of laser technology, particularly in the area of error compensation in laser systems. His innovative approach has implications for various applications, including advanced inspection tools.

Latest Patents

KuoFeng Tseng holds a patent for "Laser SDE effect compensation by adaptive tuning." This invention addresses the Laser sub-divisional error (SDE) effect, which is compensated through adaptive tuning. The compensated signal can be effectively applied to position detection of stages in electron beam inspection tools, especially for continuously moving stages. He has 1 patent to his name.

Career Highlights

KuoFeng Tseng is currently employed at Hermes Microvision Inc., where he continues to develop cutting-edge technologies. His work focuses on enhancing the precision and reliability of laser systems, contributing to advancements in the field.

Collaborations

Throughout his career, KuoFeng has collaborated with talented individuals such as Ying Luo and Zhonghua Dong. These partnerships have fostered innovation and have been instrumental in the development of new technologies.

Conclusion

KuoFeng Tseng is a distinguished inventor whose work in laser technology has paved the way for advancements in inspection tools. His contributions are vital to the ongoing evolution of precision engineering in the industry.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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