Kunihiko Hatsushika

Title: Kunihiko Hatsushika: Innovator in Reliability Evaluation Technology

Introduction

Kunihiko Hatsushika is a notable inventor based in Nirasaki, Japan. He has made significant contributions to the field of reliability evaluation technology, holding three patents that showcase his innovative spirit and technical expertise.

Latest Patents

Hatsushika's latest patents include a reliability evaluation test apparatus, a reliability evaluation test system, a contactor, and a reliability evaluation test method. The reliability evaluation test apparatus is designed to store a wafer in a state where the electrode pads of multiple devices formed on the wafer and the bumps of a contactor are in complete electrical contact. This apparatus features a hermetic and heat-insulating structure, allowing it to transmit and receive test signals to and from a measurement section. Additionally, it includes a pressure mechanism that presses the contactor and a heating mechanism that directly heats the wafer to a predetermined high temperature. This innovative design enables the evaluation of the reliability of interconnection films and insulating films formed on semiconductor wafers under accelerated conditions.

Career Highlights

Throughout his career, Kunihiko Hatsushika has worked with prominent companies such as Tokyo Electron Limited and Ibiden Company Limited. His experience in these organizations has contributed to his development as a leading inventor in his field.

Collaborations

Hatsushika has collaborated with notable colleagues, including Kiyoshi Takekoshi and Hisatomi Hosaka. Their combined expertise has likely enhanced the quality and impact of their work in reliability evaluation technology.

Conclusion

Kunihiko Hatsushika's contributions to reliability evaluation technology through his patents and career achievements highlight his role as an influential inventor. His innovative approaches continue to shape advancements in the semiconductor industry.