Kukjin Chun

Title: Kukjin Chun: Innovator in Sensor Technology and Probe Card Design

Introduction

Kukjin Chun is a notable inventor based in Seoul, South Korea. He has made significant contributions to the fields of sensor technology and probe card design. With a total of 3 patents, his work reflects a commitment to innovation and advancement in technology.

Latest Patents

One of Kukjin Chun's latest patents is a particulate matter sensor unit. This sensor unit includes an exhaust line where exhaust gas passes, and a PM sensor that generates a signal when particulate matter included in the exhaust gas passes nearby. The PM sensor is an electrostatic induction type that generates an induction charge while the charged particulate matter is in proximity.

Another significant patent is for a probe card that features a deeply recessed trench and a method for manufacturing the same. This invention allows the probe of the probe card to move only in a vertical direction, improving electrical and mechanical characteristics. The design automatically limits vertical movement within a predetermined range, enabling 32 simultaneous parallel testing, which is a significant advancement over conventional probe cards. This innovation also facilitates wafer-level testing, reducing both time and costs associated with wafer testing.

Career Highlights

Kukjin Chun has worked with prominent companies such as Samsung Electronics and Unitest Inc. His experience in these organizations has contributed to his expertise in developing cutting-edge technologies.

Collaborations

Kukjin Chun has collaborated with notable colleagues, including Eun Sung Lee and Byeong-cheon Koh. Their teamwork has likely fostered an environment of innovation and creativity in their projects.

Conclusion

Kukjin Chun's contributions to sensor technology and probe card design highlight his role as an influential inventor. His patents demonstrate a commitment to improving technology and efficiency in various applications.