The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 23, 2007
Filed:
Nov. 18, 2005
Bong Hwan Kim, Seoul, KR;
Kukjin Chun, Seoul, KR;
Doo Yun Chung, Seoul, KR;
Chi Hwan Jeong, Seoul, KR;
Bong Hwan Kim, Seoul, KR;
Kukjin Chun, Seoul, KR;
Doo Yun Chung, Seoul, KR;
Chi Hwan Jeong, Seoul, KR;
UniTest Inc., Gyeonggi-do, KR;
Abstract
The present invention relates to a probe card that a probe of the probe card is movable only in a vertical direction using a trench to improve a electrical or a mechanical characteristic and to automatically limit the vertical movement thereof within a predetermined range. A pitch may be reduced so as to correspond to a decreasing distance between pads. A flatness of a probe tip may be maintained within a few micrometers using a semiconductor manufacturing process. 32 simultaneous parallel testing is possible contrary to a convention probe card. A wafer level testing is possible, and time and cost for a wafer testing are reduced.