Company Filing History:
Years Active: 2016-2022
Title: Innovations by Kristiaan Van Rossen
Introduction
Kristiaan Van Rossen is a notable inventor based in Bierbeek, Belgium. He has made significant contributions to the field of semiconductor device inspection and imaging technologies. With a total of 2 patents, his work focuses on enhancing the detection of internal defects in various substrates.
Latest Patents
One of his latest patents is titled "Combined transmitted and reflected light imaging of internal cracks in semiconductor devices." This invention involves directing a first light source at the outer surface of a workpiece within an inspection module. The reflected light from this source is captured by a camera through a designated pathway, while the transmitted light is directed through a different pathway. Additionally, a second light source is positioned 180° from the first, allowing for comprehensive imaging of the workpiece.
Another significant patent is the "Apparatus for illuminating substrates in order to image micro cracks, pinholes and inclusions in monocrystalline and polycrystalline substrates." This apparatus utilizes a first and second illumination system to create lines of light on the substrate's front surface. The arrangement is designed to capture light transmitted through the substrate, enabling detailed imaging of potential defects.
Career Highlights
Kristiaan has worked with prominent companies in the industry, including Kla Tencor Corporation and Kla Corporation. His experience in these organizations has contributed to his expertise in semiconductor technologies and imaging systems.
Collaborations
Throughout his career, Kristiaan has collaborated with talented individuals such as Wojciech Grzegorczyk and Johan De Greeve. These partnerships have fostered innovation and advancements in their respective fields.
Conclusion
Kristiaan Van Rossen's contributions to semiconductor imaging technologies highlight his role as an influential inventor. His patents reflect a commitment to improving the detection of internal defects, showcasing his innovative spirit and technical expertise.