This inventor holds 2 USPTO granted patents. Top assignee: Kla-Tencor Technologies Corporation. Active years: 2010-2012.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2010-2012
Title: Kourosh Nafisi: Innovator in Defect Detection Technologies
Introduction
Kourosh Nafisi is a notable inventor based in Los Altos, CA. He has made significant contributions to the field of defect detection in design patterns, particularly in the semiconductor industry. With a total of 2 patents, Nafisi's work focuses on enhancing the efficiency and accuracy of defect sorting methods.
Latest Patents
Nafisi's latest patents include innovative computer-implemented methods for detecting and sorting defects in a design pattern of a reticle. One of the methods involves searching for defects of interest in inspection data by utilizing priority information associated with individual defects. This information is combined with characteristics of regions near the defects. The priority information corresponds to modulation levels linked to the individual defects. The inspection data is generated by comparing images of the reticle created for various lithographic variable values. These images consist of at least one reference image and one modulated image. A composite reference image can be generated from multiple reference images. The method also includes assigning identifiers to the defects of interest, which may encompass defect classifications and indicators for further processing.
Career Highlights
Kourosh Nafisi is currently employed at KLA-Tencor Technologies Corporation, where he applies his expertise in defect detection technologies. His work has been instrumental in advancing the capabilities of inspection systems used in semiconductor manufacturing.
Collaborations
Some of Nafisi's notable coworkers include Kenong Wu and David Winslow Randall. Their collaborative efforts contribute to the innovative environment at KLA-Tencor Technologies Corporation.
Conclusion
Kourosh Nafisi's contributions to defect detection technologies have made a significant impact in the semiconductor industry. His innovative methods continue to enhance the efficiency of defect sorting processes, showcasing his dedication to advancing technology.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile