Location History:
- Mitaka, JP (2006)
- Tokyo, JP (2016)
Company Filing History:
Years Active: 2006-2016
Title: Innovations of Konosuke Murakami
Introduction
Konosuke Murakami is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of semiconductor technology, holding a total of 2 patents. His work focuses on enhancing the efficiency and accuracy of semiconductor chip handling and testing.
Latest Patents
Murakami's latest patents include a prober designed for semiconductor testing. This prober features a wafer chuck with a conductive support surface, a movement rotation mechanism, and a head stage that holds a probe holding portion. The design allows for precise electrical connections between the stage member and the wafer chuck, facilitating effective testing of semiconductor chips. Another significant invention is a chip mis-position detection method. This method detects float or peel of semiconductor chips arranged in X and Y axes directions. It involves moving the stage to align with a position detection unit, detecting abnormal semiconductor chips, and specifying their positions on the X-Y axes.
Career Highlights
Murakami is currently employed at Tokyo Seimitsu Co., Ltd., where he continues to innovate in the semiconductor industry. His work has contributed to advancements in testing technologies that are crucial for the production of reliable semiconductor devices.
Collaborations
Throughout his career, Murakami has collaborated with talented individuals such as Toshiro Mori and Yuji Shigesawa. These collaborations have fostered a creative environment that encourages innovation and the development of cutting-edge technologies.
Conclusion
Konosuke Murakami's contributions to semiconductor technology through his patents and collaborations highlight his role as a key innovator in the field. His work continues to influence the industry and improve the efficiency of semiconductor testing processes.