logo

For the Inventor, By the Inventor

Shimosuwa, Japan

Koichi Kojima

This inventor holds 10 USPTO granted patents. Top assignee: Seiko Epson Corporation. Active years: 2004-2011.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Koichi Kojima. Retrieved from https://idiyas.com/inventor/koichi-kojima-p7ay58kn

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Calculating rank
USPTO Granted Patents = 10

% Patents Active = 30.0

Average Co-Inventor Count = 3.0

ph-index = 3

Forward Citations = 29(Granted Patents)


Location History:

  • Shimasuwa-machi, JP (2005)
  • Suwa, JP (2004 - 2006)
  • Shimosuwa-machi, JP (2004 - 2006)
  • Shimosuwa, JP (2011)

Company Filing History:

goldMedal10 out of 34,305 
 
Seiko Epson Corporation
 patents

Years Active: 2004-2011

Loading Chart...
10 patents (USPTO):Explore Patents
1. 7978903 - Defect detecting method and defect detecting device (2011-07-12),
2. 7107114 - Manufacturing system, measurement data collecting system, and measurement terminal apparatus (2006-09-12),
3. 6989894 - Lens evaluation method and lens-evaluating apparatus (2006-01-24),
4. 6978219 - Measurement data collection apparatus (2005-12-20),
5. 6934596 - Manufacturing system, measurement data collecting system, and measurement terminal apparatus (2005-08-23),
6. 6894841 - Device and method for positional adjustment of light modulator (2005-05-17),
7. 6892158 - Measurement data collection apparatus (2005-05-10),
8. 6788401 - Lens testing device and testing sheet (2004-09-07),
9. 6760097 - Lens evaluation method and lens-evaluating apparatus (2004-07-06),
10. 6760096 - Lens-evaluating method and lens-evaluating apparatus (2004-07-06),

Title: Koichi Kojima: Innovator in Defect Detection Technology

Introduction

Koichi Kojima is a prominent inventor based in Shimosuwa-machi, Japan. He has made significant contributions to the field of defect detection technology, holding a total of 10 patents. His innovative approaches have enhanced the efficiency and accuracy of inspection processes in manufacturing.

Latest Patents

Kojima's latest patents include a defect detecting method and a defect detecting device. The defect detecting method involves an image acquiring process that captures an image of an inspection object with an identical sequence of patterns. This method emphasizes defects in the captured image through a systematic process. It includes an inspected-point selecting process that sequentially selects inspection points and a defect emphasizing value calculating process that determines the defect emphasizing value based on luminance differences.

Another notable patent is related to a manufacturing system, measurement data collecting system, and measurement terminal apparatus. This system is designed to process measurement data in various formats according to the type of inspection or measuring instrument. It creates data in a compatible format and facilitates the accumulation and exchange of inspection data throughout the manufacturing process.

Career Highlights

Koichi Kojima is currently employed at Seiko Epson Corporation, where he continues to develop innovative solutions in defect detection. His work has significantly impacted the manufacturing industry, improving product quality and inspection efficiency.

Collaborations

Kojima has collaborated with notable coworkers, including Masashi Kitabayashi and Yoshifumi Yoshida. Their combined expertise has contributed to the advancement of defect detection technologies.

Conclusion

Koichi Kojima's contributions to defect detection technology exemplify his innovative spirit and dedication to improving manufacturing processes. His patents reflect a commitment to enhancing quality control in production environments.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
Loading…