The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jul. 06, 2004
Filed:
Sep. 03, 2002
Seiko Epson Corporation, Tokyo, JP;
Abstract
A method for evaluating the quality of a lens comprising illuminating imaging light on a screen through the lens to form a projected image, where the imaging light having a test-pattern image is generated using a test sheet on which a test pattern for measuring a resolution of the lens is formed to evaluate the resolution of the lens; detecting a brightness of the test-pattern image displayed on the screen by an image-capturing device using an imaging sensor; calculating an input level on the basis of the detected brightness of the test-pattern image; and calculating an evaluated value of resolution. The method, further comprises adjusting a position of the test sheet to a position corresponding to a focus of the lens by detecting the test-pattern image while moving the test sheet back and forth in the direction along an optical axis of the lens.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile