The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2006
Filed:
Apr. 25, 2005
Yoshifumi Yoshida, Suwa, JP;
Koichi Kojima, Suwa, JP;
Yuya Ichikawa, Suwa, JP;
Atsushi Harai, Suwa, JP;
Hideo Torii, Suwa, JP;
Yoshifumi Yoshida, Suwa, JP;
Koichi Kojima, Suwa, JP;
Yuya Ichikawa, Suwa, JP;
Atsushi Harai, Suwa, JP;
Hideo Torii, Suwa, JP;
Seiko Epson Corporation, , JP;
Abstract
A manufacturing system has an inspection data collecting apparatus that is capable of carrying out, upon receipt of a signal containing measurement data in different formats according to the type of inspection or a measuring instrument, processing in accordance with the signal and the format of data to create data in a certain format, and of transmitting a signal for giving an instruction to the measuring instrument in association with the format compatible with the measuring instrument. All data obtained by the inspections in all steps for manufacturing a product is accumulate as inspection data and exchanged among the steps.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile