Taichung, Taiwan

Ko-Pin Lee

This inventor holds 1 USPTO granted patent. Top assignee: Taiwan Semiconductor Manufacturing Comp. Ltd.. Active years: 2008.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Ko-Pin Lee. Retrieved from https://idiyas.com/inventor/ko-pin-lee

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


Average Co-Inventor Count = 6.0

ph-index = 1

Forward Citations = 5(Granted Patents)


Company Filing History:


Years Active: 2008

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1 patent (USPTO):Explore Patents

Title: The Innovations of Ko-Pin Lee

Introduction

Ko-Pin Lee is a notable inventor based in Taichung, Taiwan. He has made significant contributions to the field of semiconductor manufacturing. His work focuses on improving fabrication methods, which are crucial for the production of electronic components.

Latest Patents

Ko-Pin Lee holds a patent titled "Method for implementing an engineering change across fab facilities." This patent outlines a method for managing multiple fabrication facilities. The process includes identifying a proposed new or modified fabrication method, evaluating it against decision criteria, and verifying its effectiveness in producing different products. If the method meets the criteria, it is adopted as the best known method across the facilities.

Career Highlights

Ko-Pin Lee is associated with Taiwan Semiconductor Manufacturing Company Limited, a leading player in the semiconductor industry. His expertise in fabrication methods has contributed to the company's reputation for innovation and quality in manufacturing.

Collaborations

Some of his coworkers include Shih-Wen Tu and Tzu-Yu Chang, who also contribute to advancements in semiconductor technology.

Conclusion

Ko-Pin Lee's work exemplifies the importance of innovation in the semiconductor industry. His patent and contributions continue to influence fabrication processes, ensuring efficiency and quality in production.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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