The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 19, 2008
Filed:
Feb. 12, 2003
Shih-wen Tu, Taipei, TW;
Ko-pin Lee, Taichung, TW;
Tzu-yu Chang, Hsin-Chu, TW;
Chie-ming Yang, Hsin-Chu, TW;
Ming-yu Chuang, Hsin-Chu, TW;
Allen Liao, Shindian, TW;
Shih-Wen Tu, Taipei, TW;
Ko-Pin Lee, Taichung, TW;
Tzu-Yu Chang, Hsin-Chu, TW;
Chie-Ming Yang, Hsin-Chu, TW;
Ming-Yu Chuang, Hsin-Chu, TW;
Allen Liao, Shindian, TW;
Taiwan Semiconductor Manufacturing Co., Ltd., Hsin-Chu, TW;
Abstract
A method for managing a plurality of fabrication facilities comprises the steps of: identifying a proposed new or modified fabrication method, evaluating the fabrication method against decision criteria based on use of the fabrication method to fabricate a first product at a first one of the fabrication facilities, verifying the fabrication method against the decision criteria, based on using the fabrication method to fabricate a second product at a second one of the fabrication facilities, and adopting the fabrication method as a best known method among the plurality of fabrication facilities, if the fabrication method satisfies the decision criteria.