This inventor holds 1 USPTO granted patent. Top assignee: Leica Microsystems Nussloch Gmbh. Active years: 2008.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2008
Title: Klaus Foerderer: Innovator in Microtome Technology
Introduction
Klaus Foerderer is a notable inventor based in Rauenberg, Germany. He has made significant contributions to the field of microtome technology, particularly with his innovative designs that enhance the functionality of these essential laboratory instruments. His work has been recognized for its practical applications in various scientific and medical settings.
Latest Patents
Klaus Foerderer holds a patent for a feeding mechanism for a microtome. This invention is specifically designed for cryostat microtomes, which are used to cut thin sections of specimens for microscopic examination. The patent describes a feed device that allows for precise adjustment of the cut thickness of the specimen being sectioned. The mechanism involves either the cutting knife or the specimen holder being mounted on a slide within a slide guide, connected non-positively to a drive motor. The drive motor is linked to either an eccentric cam or a helical cam, facilitating the non-positive connection between the motor and the slide.
Career Highlights
Klaus Foerderer is associated with Leica Microsystems Nussloch GmbH, a company renowned for its advanced optical and imaging technologies. His role at the company has allowed him to contribute to the development of innovative solutions in microscopy and related fields. His expertise in microtome technology has positioned him as a key figure in enhancing laboratory practices.
Conclusion
Klaus Foerderer is a distinguished inventor whose work in microtome technology has made a lasting impact on scientific research. His patent for a feeding mechanism exemplifies his commitment to innovation and precision in laboratory instruments. His contributions continue to support advancements in microscopy and specimen analysis.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
