Nussloch, Germany

Leica Microsystems Nussloch Gmbh

USPTO Granted Patents = 23

% Expired Patents = 26.1

Forward Citations = 451

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26 inventors (with patents filed for the assignee):

goldMedal Roland Walter (8 out of 29 patents)

silverMedal Stefan Thiem (8 out of 21 patents)

bronzeMedal Andreas Laudat (7 out of 10 patents)

4.  Rolf Metzner (6 out of 16 patents)

5.  Holger Metzner (4 out of 9 patents)

6.  Stefan Kuenkel (4 out of 6 patents)

7.  Manfred Biehl (4 out of 8 patents)

8.  Uwe Kiene (3 out of 7 patents)

9.  Peter Scheck (2 out of 3 patents)

10.  Claudia Dorenkamp (2 out of 2 patents)

11.  Eric Barth (2 out of 4 patents)

12.  Charilaos Dalkidis (2 out of 2 patents)

13.  Bernd Guenther (2 out of 2 patents)

14.  Bernd Günther (2 out of 2 patents)

15.  Heinz Plank (1 out of 13 patents)


23 patents:

Company Overview
Leica Microsystems Nussloch GmbH specializes in the development and manufacturing of advanced optical and imaging systems, primarily for the life sciences and materials science sectors. The company is renowned for its high-quality microscopes and imaging solutions that facilitate research and diagnostics in various scientific fields. With a strong emphasis on innovation, Leica Microsystems plays a pivotal role in enhancing the capabilities of researchers and professionals globally, contributing to advancements in microscopy and imaging technologies.
Profile summary synthesized from public USPTO records and patent filings.

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USPTO Data Jan 1 1976 - Oct 20 2026

Leica Microsystems Nussloch Gmbh USPTO Patent Assignee Logo
23 Patents

#2 in Nussloch

#1,985 in Germany

#27,714 in the World

Nussloch, DE
Nussloch, Germany
Forward Citations = 451

26 inventors:

IDiyas Innovation Intelligence. (2026). Company Patent Portfolio: Leica Microsystems Nussloch Gmbh. Retrieved from https://idiyas.com/company/leica-microsystems-nussloch

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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