This inventor holds 1 USPTO granted patent. Top assignees: Carl Zeiss Sms Ltd., Synopsys, Inc.. Active years: 2014.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:

Years Active: 2014
Title: Klaus Boehm: Innovator in Mask Inspection Technology
Introduction
Klaus Boehm is a notable inventor based in Schleifreisen, Germany. He has made significant contributions to the field of mask inspection technology, particularly in the design and production of masks used in various applications.
Latest Patents
Klaus Boehm holds a patent for a "Method for mask inspection for mask design and mask production." This invention relates to a method that enables early detection of relevant weak points in mask design and production. The method involves an aerial image simulation based on the mask design converted into a mask layout. This simulation helps in determining a list of hot spots. The mask is then analyzed using an AIMS tool, which produces real aerial images that are compared with the simulated ones. The differences identified between these images are utilized to enhance the mask design. This innovative arrangement not only accelerates the mask production process but also reduces the error rate and associated costs.
Career Highlights
Throughout his career, Klaus Boehm has worked with prominent companies in the technology sector. Notably, he has been associated with Carl Zeiss SMS Ltd. and Synopsys, Inc. His work in these organizations has contributed to advancements in mask inspection methodologies.
Collaborations
Klaus Boehm has collaborated with esteemed colleagues such as Wolfgang Harnisch and Thomas Schmoeller. These partnerships have further enriched his contributions to the field of mask inspection technology.
Conclusion
Klaus Boehm's innovative approach to mask inspection has significantly impacted the efficiency and accuracy of mask design and production. His patent and collaborations reflect his commitment to advancing technology in this critical area.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile