This inventor holds 1 USPTO granted patent. Top assignee: Intel Corporation. Active years: 2008.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
Company Filing History:
Years Active: 2008
Title: Kimberly A. Ryglelski: Innovator in Wafer Polishing Control
Introduction
Kimberly A. Ryglelski is a notable inventor based in Gilbert, AZ, who has made significant contributions to the field of semiconductor manufacturing. With a focus on improving wafer polishing processes, her innovative methods have the potential to enhance the efficiency and effectiveness of this critical step in semiconductor fabrication.
Latest Patents
Kimberly holds 1 patent for her invention titled "Wafer Polishing Control." This patent discloses methods for controlling the polishing of wafers, which includes measuring pre-polish thicknesses of one or more layers of a wafer. The process involves polishing these layers and subsequently measuring the post-polish thickness. Her approach utilizes feed-forward control based on pre-polish measurements and feedback control using post-polish measurements. Additionally, she has developed machine-accessible software to implement these methods, along with systems designed for their application.
Career Highlights
Kimberly is currently employed at Intel Corporation, a leading company in the semiconductor industry. Her work at Intel has allowed her to apply her innovative ideas in a practical setting, contributing to advancements in wafer processing technologies.
Collaborations
Throughout her career, Kimberly has collaborated with talented colleagues, including Anju Narendra and Scot Goerutiz. These partnerships have fostered a creative environment that encourages the development of cutting-edge technologies in the semiconductor field.
Conclusion
Kimberly A. Ryglelski's contributions to wafer polishing control exemplify her commitment to innovation in semiconductor manufacturing. Her work not only enhances the efficiency of wafer processing but also showcases the importance of collaboration in driving technological advancements.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile
