Santa Clara, CA, United States of America

Killian Weber

This inventor holds 3 USPTO granted patents and 2 published patent applications. Top assignee: Unitx, Inc.. Active years: 2026.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Killian Weber. Retrieved from https://idiyas.com/inventor/killian-weber

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

USPTO Granted Patents = 3 

% Patents Active = 100.0

Average Co-Inventor Count = 3.6

ph-index = 1


Company Filing History:


Years Active: 2026

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3 patents (USPTO):Explore Patents

Title: Innovations of Killian Weber in Photometric Stereo Technology

Introduction

Killian Weber is an innovative inventor based in Santa Clara, CA. He has made significant contributions to the field of photometric stereo technology, particularly through his patented invention that enhances defect detection in components.

Latest Patents

Killian Weber holds a patent for a "Multichannel LED light to enable photometric stereo for 3D reconstruction." This invention provides a light system that increases reliability in detecting defects by capturing multiple images of a component under varying lighting conditions. The photometric stereo technique is employed to reconstruct a three-dimensional model of the component, which aids in performing additional operations to enhance defect detection reliability, such as measuring surface variations.

Career Highlights

Killian Weber is currently associated with Unitx, Inc., where he applies his expertise in developing advanced lighting systems. His work focuses on improving the accuracy and reliability of defect detection in various components, showcasing his commitment to innovation in technology.

Collaborations

Killian collaborates with talented individuals such as Roman Balak and Hill Ma, contributing to a dynamic work environment that fosters creativity and innovation.

Conclusion

Killian Weber's contributions to photometric stereo technology through his innovative patent demonstrate his dedication to enhancing defect detection methods. His work continues to influence the field and showcases the importance of innovation in technology.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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