The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Mar. 17, 2026
Filed:
Sep. 15, 2023
Applicant:
Unitx, Inc., Santa Clara, CA (US);
Inventors:
Tommy Liu, Santa Clara, CA (US);
Killian Weber, Santa Clara, CA (US);
Roman Balak, San Jose, CA (US);
Hill MA, Santa Clara, CA (US);
Assignee:
UnitX, Inc., Santa Clara, CA (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N 21/95 (2006.01); G01N 21/88 (2006.01); G06T 7/00 (2017.01); G06T 7/593 (2017.01);
U.S. Cl.
CPC ...
G01N 21/9515 (2013.01); G01N 21/8806 (2013.01); G01N 21/8851 (2013.01); G06T 7/0004 (2013.01); G06T 7/593 (2017.01); G01N 2021/8867 (2013.01); G01N 2021/8887 (2013.01); G06T 2207/20081 (2013.01); G06T 2207/20084 (2013.01);
Abstract
In an example, a light system is provided that allows for increased reliability in directly detecting defects in components by capturing multiple different images of the component under different lighting conditions and using a photometric stereo technique to reconstruct a three-dimensional (3D) model of the component, which can be used to perform additional operations to increase the reliability of defect detection, such as measuring the height of variations in a surface of the component.