Tokyo, Japan

Kiichiro Otsuka

This inventor holds 2 USPTO granted patents. Top assignee: Jeol Ltd.. Active years: 1989-1994.

IDiyas Innovation Intelligence. (2026). Inventor Profile: Kiichiro Otsuka. Retrieved from https://idiyas.com/inventor/kiichiro-otsuka

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile


% Patents Active = 100.0

Average Co-Inventor Count = 2.7

ph-index = 1

Forward Citations = 55(Granted Patents)


Company Filing History:


Years Active: 1989-1994

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2 patents (USPTO):Explore Patents

Title: Kiichiro Otsuka: Innovator in Analytical Instruments

Introduction

Kiichiro Otsuka is a notable inventor based in Tokyo, Japan. He has made significant contributions to the field of analytical instruments, particularly in mass spectrometry. With a total of 2 patents, Otsuka's work has advanced the capabilities of sample analysis.

Latest Patents

Otsuka's latest patents include a "Sample analyzing instrument using first and second plasma torches." This innovative analytical instrument utilizes two plasma torches, where the first torch vaporizes a sample and the second excites it for analysis. This method allows for the analysis of samples without the need for pretreatment, such as dissolving in acid. His second patent, "Ion source for use in a mass spectrometer," describes an ion source that employs a porous member to enhance the efficiency of ionization in mass spectrometry.

Career Highlights

Kiichiro Otsuka is currently employed at Jeol Ltd., a company renowned for its advanced scientific instruments. His work at Jeol Ltd. has positioned him as a key figure in the development of innovative analytical technologies.

Collaborations

Otsuka has collaborated with notable coworkers, including Mitsuyasu Iwanaga and Tsutomu Kobayashi. Their combined expertise has contributed to the advancement of analytical instrumentation.

Conclusion

Kiichiro Otsuka's contributions to the field of analytical instruments, particularly in mass spectrometry, highlight his innovative spirit and dedication to advancing technology. His patents reflect a commitment to improving sample analysis methods, making significant strides in the scientific community.

Profile summary based on public USPTO records.
Data Sources: USPTO Patent Grant XML, Patent Center, EPO & CIPO • Normalized by IDiyas Innovation Graph. Methodology & provenance architecturePlease report any incorrect information to [email protected]
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